A new module has been made available for the latest version of Delcam's PowerINSPECT inspection software that allows the software to create efficient inspection sequences for use on dual-column CNC coordinate-measuring machines.
Hexagon Metrology has released the LSP-X1h probe head for analog scanning on selected Global Silver Coordinate Measuring Machines (CMMs). The high accuracy 3D analog scanning probe rapidly collects thousands of data points for precise evaluation of complex part features.
The National Physical Laboratory (NPL), the UK’s National Measurement Institute is offering the UK’s first service the verification of Articulated Arm Co-ordinate Measurement Machines (CMMs) to the ASME B89 standard used by arm manufacturers.
The STEINBICHLER ABIS optimizer, from Steinbichler Optotechnik, claims to be the world's first portable surface testing system with depth evaluation and objective surface evaluation.
Papermakers can now benefit from improved runnability with confidence in quality provided by the sub-micron profile accuracy of the new Metso IQ Optical Caliper measurement.
OGP’s SmartScope Vantage has the ability to integrate video, touch and micro probe tactile measurement, laser scanning and white light to capture measuring data combined with multi-axis positioning into a single shopfloor hardened co-ordinate measuring centre.
Digital Surf - provider of surface imaging and metrology software solutions for a wide range of microscopes and profilometers powered by its Mountains Technology - has announced a new generation of Mountains 7 software that is compatible with scanning electron microscopes (SEM’s) and multi-spectral (Raman) instruments and also brings numerous new features and enhancements for all other supported instrument families.
The University of Manchester and FEI have announced the installation of one of the world’s most powerful high-resolution microscopes the Titan G2 80-200 scanning transmission electron microscope (S/TEM)at the University’s School of Materials. The procurement of the new S/TEM from FEI was funded as part of an £8 million ($12.8 million USD) UK government investment for nuclear materials research at Manchester’s Dalton Nuclear Institute. The Titan G2 80-200 S/TEM will enable researchers to study the structure and elemental composition of materials at the atomic level, assisting them in building a greater understanding of their behaviour and modification under certain conditions. “The new Titan microscope will play a critical role in our work to ensure the optimum performance and reliability of materials used in nuclear power generation,” stated Professor Grace Burke, director of the Materials Performance Centre (MPC), University of Manchester. “This research, primarily undertaken by the Nuclear Advanced Manufacturing Research Centre (Nuclear AMRC) and the MPC at The University of Manchester, will have benefits throughout the civil nuclear power supply chain. For example, enhanced understanding of the effects of corrosion and irradiation embrittlement on reactor pressure vessel materials can be used to aid future manufacture and extend plant life. Similarly, the performance and longevity of cladding alloys for fuel rods may be optimized with increased knowledge of the effects of irradiation on the atomic structure and composition of materials.” For more information about the Titan G2 80-200 S/TEM, please visit: http://www.fei.com/products/transmission-electron-microscopes/titan/titan-g2-80-200.aspx.
Bruker have launched the ContourGT-I 3D Optical Microscope to enhance R&D productivity and maximize manufacturing throughput for industrial applications. The ContourGT-I has been optimized to accelerate and simplify measurement setup and feature-tracking and is the world’s first bench top profiling system to incorporate Bruker’s proprietary tip/tilt head design, along with fully automated functionality, including turret, lenses, and illumination.
Carl Zeiss Microscopy’s ORION NanoFab is the first multi-ion-beam tool based on Gas Field Ion Source (GFIS) technology. As a major enhancement to the existing helium ion microscope, ORION NanoFab also utilizes neon ions.