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Olympus set nano benchmark
Even the most complex of surface topologies can be imaged and analysed with the LEXT OLS4000, the latest version of the LEXT confocal laser scanning microscope metrology system from Olympus.

QMT articles mentioning Olympus (Click on title to read)

Title	Section	Date
Opto-digital combination	Features	May 2012
Olympus Releases Stream Image-Analysis Software V. 1.8	Products	Dec 2012
Olympus releases stream image-analysis software V. 1.8	Products	Feb 2013
Higher speeds, truer colours	Products	Nov 2008
Olympus adds confocal system to its non-destructive silicon imaging range	Products	Jun 2008
Takes surface measurement to the next level	Products	Jun 2009
Corrosion mapping first	Products	Jul 2010
NPL aims at measuring standards for areal surface texture	News	Jul 2010
Joint PTB project for confocal and interferential microscope users.	News	Jan 2010
Key companies sign up for Materials Testing 2007	News	Jul 2007
Advanced 3D and 4D surface texture analysis	Products	Sep 2008
Olympus Introduces New Self-guided, Web-based Phased Array Ultrasound Tutorial	News	Dec 2007
NPL aims at measuring standards for areal surface texture	Applications	Sep 2010
Olympus NDT introduces self-guided, web-based phased array ultrasound tutorial	Products	Jan 2008
High-resolution brightfield objectives	Products	Mar 2010
Enhanced NDT software	Products	Oct 2008
Improving one's image - Better images than SEM	Applications	Jan 2008
Joint PTB project for confocal and interferential microscope users.	News	Jan 2010
Simplicity and efficiency of microscopy imaging	Products	Sep 2011
Microscopy renaissance highlighted by RMS & MICROSCIENCE 2008	News	Apr 2008
Simplifying surface metrology	Products	May 2009
Greater simplicity and higher precision in 3D	Products	Nov 2007
Industrial videoscopes for limited access	Products	Nov 2009
Remote visual inspection with lightweight systems	Products	Oct 2009
Inspex 2008 focuses on quality	Features	Sep 2008
Improving one's image	Features	Jan 2008
Semiconductor inspection from the inside	Products	Jul 2008
Digital system for colour	Products	May 2007
Industrial videoscope for limited access	Products	Dec 2009
Lighting the way with metrology	Features	Jul 2011
B-scan software option	Products	May 2008
Optimising the simplicity and efficiency of microscopy imaging in industry	Products	Feb 2012
More names for Inspex 2008	News	Apr 2008
Materials Testing 2009	Features	Sep 2009
Aerospace 08 Preview	Features	Mar 2008

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