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Stylus reduction with active scanning from Zeiss
Andrew Thompson, MD of Zeiss UK, outlines the new benefits of the Vast XTR active scanning head with rotating capability.
Company: Carl Zeiss Ltd

Carl Zeiss Ltd
2 Hadrians Way, Glebe Farm Industrial Estate, Rugby, Warwickshire, CV21 1ST, United Kingdom
Tel: +44(0)1788 8217, Fax: +44 (0) 1788 82
Web: www.zeiss.co.uk/metrology Email: metrology-sales@zeiss.co.uk

QMT articles mentioning Zeiss (Click on title to read)
Title Section Date
Class performance Features Apr 2008
Record sales for Carl Zeiss Group News Jan 2011
Carl Zeiss revenue tops four billion euros. News Jan 2012
Carl Zeiss presents positive half-yearly figures News Jun 2012
Record sales revenues for Carl Zeiss News Jan 2011
Carl Zeiss Acquires Wolf & Beck News Oct 2007
Zeiss on track for further growth News Apr 2008
Carl Zeiss on track to further growth News Mar 2008
11th Day of Microscopy at Carl Zeiss News Apr 2010
Negative 2009 but Zeiss expects recovery in 2010 News Jan 2010
Lockheed Martin recognizes Carl Zeiss for successful completion of large volume Gantry System News Jun 2008
Zeiss -new generation measurement Features May 2010
UK Centre of Excellence gets new Zeiss machine News Aug 2007
Carl Zeiss revenue tops four billion euros for first time ever News Feb 2012
Time for measurement Features Mar 2013
Reference lab opened for Zeiss nanometre range News Jun 2009
Ambitious microscopy development by Zeiss News Apr 2009
Ambitious microscopy development by Zeiss News Mar 2009
Metrotomography measuring technology enables perfect fit of dental prosthetics Applications Mar 2009
Lockheed Martin awards Carl Zeiss $5m contract for high-accuracy gantry system News Mar 2007
Tons of precision Features Oct 2012
Shopfloor scanning CMM debut at Control 2008 Features Apr 2008
Carl Zeiss UK Further Expands Its Contract Measurement Services News Oct 2007
Carl Zeiss opens Technology Centre in India News May 2008
Cooperation between Carl Zeiss and German National Metrology Institute News Mar 2008
Metrotomography - CAD Modelling in Metrology Products Sep 2007
FIB/SEM technology with Laser Ablation for fast sample preparation Products Jun 2012
Helium-Ion microscope order for Zeiss News May 2010
A first for CECA Products Sep 2007
25,000th Measuring Machine from Carl Zeiss delivered to MTU News Nov 2007
Zeiss booming News Mar 2007
Global web-based metrology portal Products Mar 2010
Seeing is believing Features Feb 2012
Small yet large Products Aug 2012
Small yet large Products Jun 2012
Zeiss sales and earnings up in first 6 months News Jul 2011
Up to any challenge Products Jul 2011
Gold probe from Carl Zeiss increases productivity Products Aug 2012
Large parts can be measured more quickly and accurately Products Sep 2011
Wear-free scanning - even with rough surfaces Products Oct 2008
Multisensor CMM optimizes quality assurance in dental technology Features Dec 2009
Gold probe from Carl Zeiss increases productivity Products Oct 2012
Carl Zeiss presents positive half-yearly figures News Aug 2012
Capture 1000’s of features Features Nov 2007
Control 2011 review Features May 2011
Dual use measurement with combination instruments from Carl Zeiss Products Sep 2007
Editor’s comment: Turnaround News Mar 2011
Fully automatic 3D surface inspection on the production line News May 2010
Carl Zeiss develops completely new ACCURA 3D coordinate measuring machine Products May 2009
Bosch Supplier Award for Carl Zeiss News Sep 2007
Metrotomography measuring technology enables perfect fit of dental prosthetics Features Apr 2009
Microscopy renaissance highlighted by RMS & MICROSCIENCE 2008 News Apr 2008
Data anytime Features Sep 2009
Speakers from NPL, BAE Systems and Roll-Royce support Make Measurement Matter News Oct 2012
On track for further growth and investment - Carl Zeiss News Feb 2013
Zeiss large volume CMM a success for F-35 News Jul 2008
MEDTEC 2008 preview Features Jan 2008
Carl Zeiss installs first AURIGA CrossBeam Workstation News Jul 2009
Shopfloor version of Zeiss DuraMax Products Oct 2011
CNC inspection of small, complex parts Products Jul 2007
X-ray inspection of complex small parts Products Jun 2009
FIB/SEM technology with laser ablation for fast sample preparation Products Aug 2012
Retrofit debut Features Mar 2009
Improved Helium Ion microscope sets new standards for imaging resolution & brightness Products Sep 2008
Navigator Technology for CONTURA G2 Products Mar 2010
Improving your CMM efficiency with CALYPSO 5.0 Products Aug 2010
Control 2007 review Features Jul 2007
Specimen cutting made easy Products Jul 2008
Increasing efficiency with CALYPSO 5.0 Products Sep 2010
Gear measurements easier than ever Products Oct 2011
Data management system optimises quality assurance News Jan 2010
Sensor-specific measuring strategies Products Mar 2008
Editor's Comment: Timer is money News Nov 2012
Measuring on a large scale News Jan 2010
Modular CMM for maximum flexibility Products Jun 2009
High definition FE-SEM Products Oct 2012
Carl Zeiss launches CALYPSO 4.6 Products Jan 2008
Small and extremely precise CMM Products Apr 2012
Measures fine roughness and soft surfaces Products Mar 2009
Surface topography module enhances image analysis software Products Mar 2009
QA data management Products Jan 2010
Expands the stereo boundaries Products Jul 2007
Fast and efficient material analysis Products Apr 2012
Extending nanofabrication to the sub-10 nanometer scale Products Nov 2012
Dual use measurement Products Nov 2007
Scanner closes gap with tactile probe accuracy Products Mar 2012
Form and surface measurements - all in the document Products May 2010
Speedy analysis Products Nov 2007
Seeing (through) is believing News Nov 2007
Metrology Tour at Derby News Mar 2013
Zoom microscope with high resolution for large object fields Products Aug 2012
Measure quickly and reliably Products Jun 2010
Intelligent microscope control and image evaluation software Products Oct 2008
Blade measuring revolution for AugustaWestland Applications Oct 2010
Metrology for nanotechnology Features Sep 2009
MICROSCIENCE 2010 Features May 2010
Editor's comment News Jan 2010
Wenzel - the first 40 years Features Sep 2008
Conference Report - MetroMeet 2010, Bilbao, Spain News Apr 2010
CMM for sale - one lady owner Features Jul 2007
CECA hosts successful international precision assembly seminar News Apr 2008
Breaking new ground Features Nov 2011
CECA hosts international precision assembly seminar News May 2008
TCT Live preview Features Sep 2011
Retrofit your CMM Features Mar 2007
Virtual CMM Features Nov 2012
Sensor for MASS Products Mar 2008
Focus on Nikon Features Apr 2010
Agile metrology Features Mar 2011
Data-driven Nissan Features May 2007
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