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Innovation is the way to beat downturn says Zeiss
Investment in new product development and process chain efficiency is the key to coming out of the economic downturn says Zeiss CEO Dr Rainer Ohnheiser
Company: Carl Zeiss Ltd

Carl Zeiss Ltd
2 Hadrians Way, Glebe Farm Industrial Estate, Rugby, Warwickshire, CV21 1ST, United Kingdom
Tel: +44(0)1788 8217, Fax: +44 (0) 1788 82
Web: www.zeiss.co.uk/metrology Email: metrology-sales@zeiss.co.uk

QMT articles mentioning Zeiss (Click on title to read)
Title Section Date
Class performance Features Apr 2008
Zeiss on track for further growth News Apr 2008
Carl Zeiss Acquires Wolf & Beck News Oct 2007
11th Day of Microscopy at Carl Zeiss News Apr 2010
Carl Zeiss on track to further growth News Mar 2008
Zeiss -new generation measurement Features May 2010
Negative 2009 but Zeiss expects recovery in 2010 News Jan 2010
Lockheed Martin recognizes Carl Zeiss for successful completion of large volume Gantry System News Jun 2008
UK Centre of Excellence gets new Zeiss machine News Aug 2007
Reference lab opened for Zeiss nanometre range News Jun 2009
Ambitious microscopy development by Zeiss News Apr 2009
Metrotomography measuring technology enables perfect fit of dental prosthetics Applications Mar 2009
Ambitious microscopy development by Zeiss News Mar 2009
Lockheed Martin awards Carl Zeiss $5m contract for high-accuracy gantry system News Mar 2007
Carl Zeiss opens Technology Centre in India News May 2008
Shopfloor scanning CMM debut at Control 2008 Features Apr 2008
Cooperation between Carl Zeiss and German National Metrology Institute News Mar 2008
Carl Zeiss UK Further Expands Its Contract Measurement Services News Oct 2007
Helium-Ion microscope order for Zeiss News May 2010
Global web-based metrology portal Products Mar 2010
25,000th Measuring Machine from Carl Zeiss delivered to MTU News Nov 2007
Metrotomography - CAD Modelling in Metrology Products Sep 2007
A first for CECA Products Sep 2007
Zeiss booming News Mar 2007
Multisensor CMM optimizes quality assurance in dental technology Features Dec 2009
Wear-free scanning - even with rough surfaces Products Oct 2008
Fully automatic 3D surface inspection on the production line News May 2010
Data anytime Features Sep 2009
Carl Zeiss installs first AURIGA CrossBeam Workstation News Jul 2009
X-ray inspection of complex small parts Products Jun 2009
Carl Zeiss develops completely new ACCURA 3D coordinate measuring machine Products May 2009
Metrotomography measuring technology enables perfect fit of dental prosthetics Features Apr 2009
Retrofit debut Features Mar 2009
Zeiss large volume CMM a success for F-35 News Jul 2008
Microscopy renaissance highlighted by RMS & MICROSCIENCE 2008 News Apr 2008
MEDTEC 2008 preview Features Jan 2008
Capture 1000’s of features Features Nov 2007
Dual use measurement with combination instruments from Carl Zeiss Products Sep 2007
Bosch Supplier Award for Carl Zeiss News Sep 2007
CNC inspection of small, complex parts Products Jul 2007
Increasing efficiency with CALYPSO 5.0 Products Sep 2010
Improving your CMM efficiency with CALYPSO 5.0 Products Aug 2010
Navigator Technology for CONTURA G2 Products Mar 2010
Data management system optimises quality assurance News Jan 2010
Improved Helium Ion microscope sets new standards for imaging resolution & brightness Products Sep 2008
Specimen cutting made easy Products Jul 2008
Sensor-specific measuring strategies Products Mar 2008
Control 2007 review Features Jul 2007
Measure quickly and reliably Products Jun 2010
Form and surface measurements - all in the document Products May 2010
QA data management Products Jan 2010
Measuring on a large scale News Jan 2010
Modular CMM for maximum flexibility Products Jun 2009
Measures fine roughness and soft surfaces Products Mar 2009
Surface topography module enhances image analysis software Products Mar 2009
Intelligent microscope control and image evaluation software Products Oct 2008
Carl Zeiss launches CALYPSO 4.6 Products Jan 2008
Speedy analysis Products Nov 2007
Dual use measurement Products Nov 2007
Seeing (through) is believing News Nov 2007
Expands the stereo boundaries Products Jul 2007
MICROSCIENCE 2010 Features May 2010
Focus on Nikon Features Apr 2010
Conference Report - MetroMeet 2010, Bilbao, Spain News Apr 2010
Editor's comment News Jan 2010
Metrology for nanotechnology Features Sep 2009
Wenzel - the first 40 years Features Sep 2008
CECA hosts international precision assembly seminar News May 2008
CECA hosts successful international precision assembly seminar News Apr 2008
Sensor for MASS Products Mar 2008
CMM for sale - one lady owner Features Jul 2007
Data-driven Nissan Features May 2007
Retrofit your CMM Features Mar 2007
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